New Methods for Scanning Ultrasonic Microscopy - Applications for Failure Analysis of Microassembling Technologies

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https://hal.archives-ouvertes.fr/hal-00182915
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Submitted on : Monday, October 29, 2007 - 1:11:09 PM
Last modification on : Thursday, January 11, 2018 - 6:21:07 AM

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  • HAL Id : hal-00182915, version 1

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Laurent Bechou, Yves Ousten, Yves Danto. New Methods for Scanning Ultrasonic Microscopy - Applications for Failure Analysis of Microassembling Technologies. IPFA 2001, 2001, Singapore. pp.1. ⟨hal-00182915⟩

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