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Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics

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https://hal.archives-ouvertes.fr/hal-00182908
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Submitted on : Monday, October 29, 2007 - 1:11:05 PM
Last modification on : Thursday, October 4, 2018 - 11:14:07 AM

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  • HAL Id : hal-00182908, version 1

Citation

Grégory Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Bernard Plano, et al.. Structural Analysis of Integrated Circuits Using Scanning Laser Ultrasonics. IEEE International Reliability Physics Symposium (IRPS), 2004, United States. pp.1. ⟨hal-00182908⟩

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