A Quasi-Optical Free-Space Measurement Setup Without Time-Domain Gating for Material Characterization in the W-Band

Daniel Bourreau (1, 2) , Alain Peden (1, 2) , Sandrick Le Maguer (1, 2)

1 MO - Département Micro-Ondes
2 TAMCIC - Traitement Algorithmique et Matériel de la Communication, de l'Information et de la Connaissance

In this paper, a new free-space measurement setup at millimeter waves for material characterization is presented. Using specific Gaussian optics lens antennas and a thru, reflect, and line calibration, the setup provides the free-space four S-parameters over the W-band of planar dielectric slabs without time-domain gating. An efficient optimization procedure is implemented to extract complex permittivity from the four S-parameters of homogeneous dielectric materials. Non homogeneous materials can also be tested, and measurements are presented. Very good agreement is observed between simulated and measured four S-parameters of various dielectric plates. Thanks to this new specific calibration and measurement procedure, automation of the test bench is easily achieved.

Mots clés: free-space calibration; free-space setup; Gaussian beam; material characterization; permittivity measurement

Domaines: Matériaux; Micro et nanotechnologies/Microélectronique

Daniel Bourreau, Alain Peden, Sandrick Le Maguer. A Quasi-Optical Free-Space Measurement Setup Without Time-Domain Gating for Material Characterization in the W-Band. IEEE Transactions on Instrumentation and Measurement, 2006, 55 (6), pp.2022-2028. ⟨10.1109/TIM.2006.884283⟩. ⟨hal-00177448⟩