Quantifying thermal spray coating architecture by stereological protocols. Part II. Key points to be addressed

Guy Antou (1) , Ghislain Montavon (1)

1 SPCTS - Science des Procédés Céramiques et de Traitements de Surface

This commentary aims at presenting, from a practical viewpoint, some key points to assess when implementing image analysis coupled to stereological protocols to quantify statistically the architecture of thermal spray coatings and their relevant features (pores, lamellae, and so forth.). This article is the second of a two-part commentary; the first one, published in Journal of Thermal Spray Technology, Vol 16 (No. 1), 2007, detailed those stereological protocols from a historical perspective.

Mots clés: image analysis; image capture; polishing protocol; stereology; structural quantification

Guy Antou, Ghislain Montavon. Quantifying thermal spray coating architecture by stereological protocols. Part II. Key points to be addressed. Journal of Thermal Spray Technology, 2007, 16, pp.168-176. ⟨10.1007/s11666-007-9037-4⟩. ⟨hal-00176464⟩