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"Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry"

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Conference papers
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https://hal.archives-ouvertes.fr/hal-00080025
Contributor : Nathalie Bonneval <>
Submitted on : Wednesday, June 14, 2006 - 2:13:13 PM
Last modification on : Sunday, September 6, 2020 - 2:16:04 PM

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  • HAL Id : hal-00080025, version 1

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V. Rouessac, R. Coustel, F. Bosc, J. Durand, A. Ayral. "Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry". 2005. ⟨hal-00080025⟩

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