A SNDR BIST for SigmaDelta Analogue-to-Digital Converters

L. Rolindez (1) , Salvador Mir (1) , Ahcène Bounceur (1) , J.L. Carbonero (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 ST-CROLLES - STMicroelectronics [Crolles]

The test of high resolution Sigma-Delta Analogueto- Digital Converters (SigmaDelta ADCs) is a costly task due to its high resolution and the large number of samples required. In this paper, we propose a Built-In Self-Test (BIST) technique for the test of SNDR (Signal-to-Noise plus Distortion Ratio) in SigmaDelta ADCs. The technique, mostly digital, uses a binary stream as test stimulus and carries out a sine-wave fitting algorithm to analyse the output response. Both the test signal generation and the output response analysis are performed on-chip, taking advantage of the digital resources already present in a SigmaDelta ADC. Simulations results show the capability of this technique to obtain measures of the SNDR for a 16-bit audio SigmaDelta ADC.

Domaines: Micro et nanotechnologies/Microélectronique

L. Rolindez, Salvador Mir, Ahcène Bounceur, J.L. Carbonero. A SNDR BIST for SigmaDelta Analogue-to-Digital Converters. VLSI Test Symposium, 2006. Proceedings. 24th IEEE, 30-04 April, 2006, Berkeley, California, United States. pp.314- 319, ⟨10.1109/VTS.2006.12⟩. ⟨hal-00079708⟩