Observation of the interferences between the emitted beams in a 4Pi microscope by partial coherence interferometry

N. Sandeau (1) , H. Giovannini (1) , P.-F. Lenne (1) , H. Rigneault (1)

1 FRESNEL - Institut FRESNEL

We propose a modified 4Pi microscope setup for observing solely the interference resulting from the superposition of the beams emitted by fluorescent species placed between two microscope objectives. A scanning Michelson interferometer is coupled to the 4Pi microscope and permits one to localize the fluorescent species with subwavelength resolution thanks to partial coherence interferometry technique.

Mots clés: 4Pi microscopy; axial localization

Domaines: Optique [physics.optics]; Instrumentations et Détecteurs [physics.ins-det]; Biophysique [physics.bio-ph]

N. Sandeau, H. Giovannini, P.-F. Lenne, H. Rigneault. Observation of the interferences between the emitted beams in a 4Pi microscope by partial coherence interferometry. Applied Physics Letters, 2005, 87, pp.181103. ⟨hal-00078951⟩