Utilisation des statistiques d'ordres supérieurs en contrôle qualité de détecteurs de rayons X
Résumé
A quality control method for X-ray detector is proposed in this paper. The process is based on the statistical properties of the images obtained with this detector. Higher Order Statistics (HOS) tools, and more specifically the kurtosis (4th order statistical value), are used on these images in order to highlight the regions of interest likely to contain artifacts a human expert has to detect rapidly. The properties of these small structures being different from the background, HOS allow to extract the corresponding regions from the rest of the image. The results (size and amplitude of the highlighted regions) will help the expert to analyse the artifact.