Single-event-upset-like fault injection: a comprehensive framework

F. Faure (1) , Raoul Velazco (2) , P. Peronnard (2)

1 IASF-MI - Istituto di Astrofisica Spaziale e Fisica Cosmica - Milano
2 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés

An approach to reproduce radiation ground testing results for the study of microprocessors vulnerability to single event upset (SEU) is described in this paper. Resulting cross-sections fit very well with measured ones.

Mots clés: radiation-ground-testing; microprocessors-vulnerability; single-event-upset; FPGA-based-fault-injection

Domaines: Micro et nanotechnologies/Microélectronique

F. Faure, Raoul Velazco, P. Peronnard. Single-event-upset-like fault injection: a comprehensive framework. IEEE Transactions on Nuclear Science, 2005, Dec. ; 52(6), pp.2205-9. ⟨10.1109/TNS.2005.860689⟩. ⟨hal-00022050⟩