High resolution electron microscopy and spectroscopy (EDX, XPS, LEIS) study of Pd supported catalyst on α and β silicon nitride used in the total oxidation of methane - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2005

High resolution electron microscopy and spectroscopy (EDX, XPS, LEIS) study of Pd supported catalyst on α and β silicon nitride used in the total oxidation of methane

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Catalyse
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hal-00013952 , version 1 (15-11-2005)

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  • HAL Id : hal-00013952 , version 1

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F.J. Cadete Santos Aires, I. Kurzina, G. Garcia Cervantes, J.C. Bertolini. High resolution electron microscopy and spectroscopy (EDX, XPS, LEIS) study of Pd supported catalyst on α and β silicon nitride used in the total oxidation of methane. Microscopy in Motion – XLth Meeting of the SPME-BC, 2005, Lisbon, Portugal. pp.8 - 11 décembre. ⟨hal-00013952⟩

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