SEU and latch-up results on transputers

F. Bezerra (1) , Raoul Velazco (1) , A. Assoum (1) , D. Benezech (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 EREMS - EREMS

IMST805 and IMST225 transputers are being considered for space applications. In a view to predict their in orbit behaviour, their sensitivity to single event phenomena has been evaluated under heavy ion irradiation.

Mots clés: single-event-upset; SEU-sensitivity; latchup-sensitivity; transputers-; IMST805-; IMST225-; space-applications; in-orbit-behaviour-prediction; single-event-phenomena; heavy-ion-irradiation

Domaines: Micro et nanotechnologies/Microélectronique

F. Bezerra, Raoul Velazco, A. Assoum, D. Benezech. SEU and latch-up results on transputers. 1996, pp.340-345, ⟨10.1109/RADECS.1995.509800⟩. ⟨hal-00008255⟩