SEU-hardened storage cell validation using a pulsed laser

Raoul Velazco (1) , T. Calin (1) , M. Nicolaidis (1) , S. Moss (2) , S.D. La Lumondiere (2) , V.T. Tran (2) , R. Koga (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 THE AEROSPACE CORP. - The Aerospace Corp.

Laser tests performed on a prototype chip to validate new SEU-hardened storage cell designs revealed unexpected latch-up and single-event upset phenomena. The investigations that identified their location show the existence of a topology-dependent dual node upset mechanism. Design solutions are suggested to avoid its occurrence.

Mots clés: SEU-hardening; storage-cell; validation-; latch-up; single-event-upset; pulsed-laser-testing

Domaines: Micro et nanotechnologies/Microélectronique

Raoul Velazco, T. Calin, M. Nicolaidis, S. Moss, S.D. La Lumondiere, et al.. SEU-hardened storage cell validation using a pulsed laser. IEEE Transactions on Nuclear Science, 1996, Dec. 1996; 43(6) pt. 1, pp.2843-8. ⟨10.1109/23.556875⟩. ⟨hal-00008252⟩