Pulsed laser validation of recovery mechanisms of critical SEEs in an artificial neural network system

S. Buchner (1) , M. Olmos (2) , P. Cheynet (2) , Raoul Velazco (2) , D. Mcmorrow (3) , J. Melinger (3) , R. Ecoffet (2) , J.D Muller (4)

1 SFA INC/NRL - SFA Inc/NRL
2 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
3 NRL - Naval Research Laboratory
4 DAM/DIF - DAM Île-de-France

A pulsed laser was used to inject errors into an electronic system consisting of a number of different integrated circuits functioning as a digital version of an artificial neural network. The results confirm that the system as a whole can operate autonomously in the radiation environment of space. Additional work was done to characterize the effects of the upsets on the output of the artificial neural network.

Mots clés: pulsed-laser-irradiation; recovery-; critical-SEE; artificial-neural-network; error-injection; electronic-system; digital-integrated-circuit; space-radiation-environment

Domaines: Micro et nanotechnologies/Microélectronique

S. Buchner, M. Olmos, P. Cheynet, Raoul Velazco, D. Mcmorrow, et al.. Pulsed laser validation of recovery mechanisms of critical SEEs in an artificial neural network system. IEEE Transactions on Nuclear Science, 1998, June 1998; 45(3) pt. 3, pp.1501-7. ⟨10.1109/23.685230⟩. ⟨hal-00008247⟩