Deep submicron CMOS technologies for the LHC experiments
Résumé
The harsh radiation environment at the Large Hadron Collider (LHC) requires radiation hard ASICs. This paper presents how a high tolerance for total ionizing dose can be obtained in commercial deep submicron technologies by using enclosed NMOS devices and guard rings. The method is explained, demonstrated on transistor and circuit level, and design implications are discussed. A model for the effective W/L of an enclosed transistor is given, a radiation-tolerant standard cell library is presented, and single event effects are discussed
Mots clés
LHC-experiments
radiation-hard-ASICs
total-ionising-dose
enclosed-NMOS-devices
guard-rings
deep-submicron-CMOS-technologies
circuit-level
transistor-level
design-implications
single-event-effects
effective-W-L
radiation-tolerance-design
aspect-ratio
radiation-tolerant-standard-cell-library
detectors-front-end-electronics
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