Injecting bit flip faults by means of a purely software approach: a case studied

Raoul Velazco (1) , A. Corominas (1) , P.A. Ferraya (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 Universidad Nacional de Córdoba [Argentina]

Bit flips provoked by radiation are a main concern for space applications. A fault injection experiment performed using a software simulator is described in this paper. Obtained results allow us to predict a low sensitivity to soft errors for the studied application, putting in evidence critical memory elements.

Mots clés: radiation-environment; bit-flip-faults; fault-injection; software-simulator; soft-errors; SEU-sensitivity-evaluation; low-error-sensitivity; microelectronic-circuits; DSP32C-digital-signal-processor; memory-elements

Domaines: Micro et nanotechnologies/Microélectronique

Raoul Velazco, A. Corominas, P.A. Ferraya. Injecting bit flip faults by means of a purely software approach: a case studied. 2002, pp.108-116, ⟨10.1109/DFTVS.2002.1173507⟩. ⟨hal-00008199⟩