Fault-based testing and diagnosis of balanced filters

Salvador Mir (1) , Marcelo Lubaszewski (1) , V. Kolarik (2) , B. Courtois (1)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 UFRGS - DELET, Univ. Federal do Rio Grande do Sul

The test and diagnosis of fully differential analogue filters are addressed in this paper. Full coverage of hard/soft faults affecting circuit behaviour can be achieved by adjusting the tolerance window of the built-in self-test circuitry and the amplitude and frequency of the input test signal. Under a single fault assumption, the faulty active or passive component is located and the actual defective value of a faulty passive component is determined. A test generation procedure which results in maximum fault coverage and maximal diagnosis of hard/soft faults in the filter is presented. The test and diagnosis approach can be made compatible with IEEE Std 1149.1 for boundary scan testing.

Mots clés: balanced filters; analogue; BIST; fault diagnosis; ATPG

Domaines: Micro et nanotechnologies/Microélectronique

Salvador Mir, Marcelo Lubaszewski, V. Kolarik, B. Courtois. Fault-based testing and diagnosis of balanced filters. Analog Integrated Circuits and Signal Processing, 1996, September, Volume 11, Number 1, pp.5-19. ⟨10.1007/BF00174235⟩. ⟨hal-00008175⟩