Towards self-checking mixed-signal integrated circuits

V. Kolarik (1) , Marcelo Lubaszewski (2) , B. Courtois (2)

1 UFRGS - DELET, Univ. Federal do Rio Grande do Sul
2 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés

In this paper, we address the design of analogue sections of mixed-signal integrated circuits which comply with existing self-checking digital sections. Fully differential analogue functional blocks and associated checkers are examined. The goal is to produce a mixed-signal design-for-test solution which fits the concurrent error detection and high performance requirements of safety-critical applications.

Mots clés: self-checking-mixed-signal-integrated-circuits; self-checking-analogue-IC-section-design; self-checking-digital-IC-sections; differential-analogue-functional-blocks; analogue-checkers; mixed-signal-design-for-test; concurrent-error-detection; safety-critical-applications

Domaines: Micro et nanotechnologies/Microélectronique

V. Kolarik, Marcelo Lubaszewski, B. Courtois. Towards self-checking mixed-signal integrated circuits. 1993, pp.202-5. ⟨hal-00007943⟩