SWITTEST: Automatic Switch-level Fault Simulation and Test Evaluation of Switched-Capacitor Systems

Salvador Mir (1) , A. Rueda (2) , T. Olbrich (3) , E. Peralias (2) , J.L. Huertas (2)

1 TIMA - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
2 IMSE-CNM - Instituto de Microelectrónica de Sevilla
3 AMS - Austria Mikro Systeme Int. AG, Austria

A tool for the switch-level fault simulation and test evaluation of switched-capacitor systems is presented. Time or frequency-domain fault simulations with SWITCAP and time-domain fault simulations with HSPICE can be performed. Adequate fault models are presented for both simulators. The tool has proven to be very useful in the early evaluation of test strategies, providing similar results to those obtained at the transistor-level.

Domaines: Autre; Micro et nanotechnologies/Microélectronique

Salvador Mir, A. Rueda, T. Olbrich, E. Peralias, J.L. Huertas. SWITTEST: Automatic Switch-level Fault Simulation and Test Evaluation of Switched-Capacitor Systems. Design Automation Conference, 34th Conference on (DAC'97), 1997, Anaheim, California, United States. pp.281, ⟨10.1109/DAC.1997.597158⟩. ⟨hal-00005879⟩