Sensing temperature in CMOS circuits for thermal testing

J. Altet (1) , A. Rubio , A. Salhi (2) , J. L. Galvez , Stefan A Dilhaire (2) , A. Syal , A. Ivanov (3)

1 Electronic Engineering Department
2 CPMOH - Centre de physique moléculaire optique et hertzienne
3 ILL - Institut Laue-Langevin

Domaines: Physique [physics]

J. Altet, A. Rubio, A. Salhi, J. L. Galvez, Stefan A Dilhaire, et al.. Sensing temperature in CMOS circuits for thermal testing. 22nd Ieee Vlsi Test Symposium, Proceedings, pp.179-184, 2004, IEEE VLSI Test Symposium, 0-7695-2134-7. ⟨10.1109/vtest.2004.1299241⟩. ⟨hal-01840910⟩