Overview of thermal studies on photonics devices for reliability, robustness and new design

Y. Deshayes (1) , A. Royon (2) , R. Baillot (1) , L. Bechou (1) , L. Canioni (2) , Y. Petit (3) , Th. Cardinal (3) , I. Bord (1) , B. Levrier (1) , Y. Ousten (1)

1 IMS - Laboratoire de l'intégration, du matériau au système
2 LOMA - Laboratoire Ondes et Matière d'Aquitaine
3 ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux

Domaines: Electronique

Y. Deshayes, A. Royon, R. Baillot, L. Bechou, L. Canioni, et al.. Overview of thermal studies on photonics devices for reliability, robustness and new design. 18th International Workshop on Thermal investigations of ICs and Systems (THERMINIC), Sep 2012, Budapest, Hungary. ⟨hal-00786204⟩