Study of ceramic materials in the SrSnO₃–NaNbO₃ system by X-ray diffraction, dielectric and Raman spectroscopy

Abdelhedi Aydi (1) , Hamadi Khemakhem (2) , Annie Simon (3) , Dominique Michau (3) , Régnault von Der Mühll (3)

1 Laboratoire des Matériaux Ferroélectriques
2 LMF - Laboratoire des Matériaux Ferroélectriques
3 ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux

Ceramics with composition belonging to the SrSnO₃–NaNbO₃ system were sintered in the temperature range 1100–1350 °C. The symmetry, dielectric properties and Raman spectroscopy were investigated. X-ray diffraction results demonstrate that a region with the cubic or tetragonal phases lies in the composition range x < 0.89 and x ≥ 0.89, respectively.

Mots clés: Ceramic; Dielectric; Ferroelectric; Relaxor; Raman and X-ray diffraction

Domaines: Matériaux

Abdelhedi Aydi, Hamadi Khemakhem, Annie Simon, Dominique Michau, Régnault von Der Mühll. Study of ceramic materials in the SrSnO₃–NaNbO₃ system by X-ray diffraction, dielectric and Raman spectroscopy. Journal of Alloys and Compounds, 2009, 484 (1-2), pp.356-359. ⟨10.1016/j.jallcom.2009.04.097⟩. ⟨hal-00432656⟩