Processing and characterization of new oxysulfide glasses in the Ge–Ga–As–S–O system

Clément Maurel (1) , Laëtitia Petit (2) , Marc Dussauze (3) , Efstratios I. Kamitsos (3) , Michel Couzi (4) , Thierry Cardinal (1) , A. C. Miller (5) , H. Jain (5) , Kathleen Richardson (2)

1 ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux
2 School of Materials Science and Engineering
3 Theoretical and Physical Chemistry Institute
4 ISM - Institut des Sciences Moléculaires
5 Center for Optical Technologies and Department of Materials Science and Engineering

New oxysulfide glasses have been prepared in the Ge–Ga–As system employing a two-step melting process which involves the processing of the chalcogenide glass (ChG) and its subsequent melting with amorphous GeO2 powder. Optical characterization of the synthesized oxysulfide glasses has shown that the cut-off wavelength decreases with increasing oxygen content, and this has been correlated to results of Raman and infrared (IR) spectroscopies which show the formation of new oxysulfide structural units. X-ray photoelectron spectroscopy (XPS) analysis to probe the bonding environment of oxygen atoms in the oxysulfide glass network, has revealed the preferred formation of Ga–O and Ge–O bonds in comparison to As–O bonds. This work has demonstrated that melting a ChG glass with GeO2 leads to the formation of new oxysulfide glassy materials.

Mots clés: Oxysulfide; Raman and IR spectroscopies; XPS

Domaines: Matériaux

Clément Maurel, Laëtitia Petit, Marc Dussauze, Efstratios I. Kamitsos, Michel Couzi, et al.. Processing and characterization of new oxysulfide glasses in the Ge–Ga–As–S–O system. Journal of Solid State Chemistry, 2008, 181 (10), pp.2869-2876. ⟨10.1016/j.jssc.2008.07.019⟩. ⟨hal-00339229⟩