Atomic force microscopy and x-ray photoelectron spectroscopy investigations of the morphology and chemistry of a PdCl2/SnCl2 electroless plating catalysis system adsorbed onto shape memory alloy particles

Jean-François Silvain (1) , Olivier Fouassier (1) , S. Lescaux (2)

1 ICMCB - Institut de Chimie de la Matière Condensée de Bordeaux
2 Veeco

A study of the different stages of the electroless deposition of copper on micronic NiTi shape memory alloy particles activated by one-step and two-step methods has been conducted from both a chemical and a morphological point of view. The combination of x-ray photoelectron spectroscopy (XPS) measurements and atomic force microscopy (AFM) imaging has allowed detection of the distribution of the formed compounds and depth quantification and estimation of the surface topographic parameters...

Mots clés: Palladium chloride; Tin chloride; Copper; Electroless plating; Catalysis; Shape memory alloy; Particle electroless; AFM; XPS

Domaines: Matériaux

Jean-François Silvain, Olivier Fouassier, S. Lescaux. Atomic force microscopy and x-ray photoelectron spectroscopy investigations of the morphology and chemistry of a PdCl2/SnCl2 electroless plating catalysis system adsorbed onto shape memory alloy particles. Journal of Applied Physics, 2004, 96 (9), pp.4945-4951. ⟨10.1063/1.1787625⟩. ⟨hal-00160329⟩