Determination of critical island size in -sexiphenyl islands on SiO using capture-zone scaling
Résumé
One of the important parameters in understanding the mechanism of the early stage of organic thin-film growth is the critical nucleus size . Here, submonolayer films of -sexiphenyl grown on amorphous silicon dioxide substrates were investigated by means of atomic-force microscopy and have been analyzed using the recently proposed capture-zone scaling. Applying the generalized Wigner surmise we determine from the capture-zone distribution at room temperature and 373 K. The results are compared to traditional analysis by island-size scaling and the applicability of the capture-zone scaling is critically discussed with respect to island shape.
Domaines
Physique [physics]
Origine : Fichiers produits par l'(les) auteur(s)
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