Effect of particle size and spectral sub-range within the UV-VIS-NIR range using diffuse reflectance spectra on multivariate models in evaluating the severity of fusariosis in ground wheat
Résumé
Control (crops grew in natural conditions) and FHB (Fusarium head blight) damaged (crops inoculated with Fusarium culmorum conidia) grain of four wheat cultivars was ground and sieved into three fractions of particle size. Series of blended samples differing in the content of damaged material were prepared within fractions and cultivars, and diffuse reflectance spectra recorded within the 200-2500nm wavelength range. PLS models for the percentage of damaged material in blended samples were built for each of 12 series within different spectral ranges, and the root mean squared error of cross-validation (RMSECV) used for assessment of model performance. Errors of the models were lowest for the finest fraction independent of spectral range, however, their values depended on the cultivar. RMSECV for the finest fraction averaged over cultivars ranged from a little below 3.0 (when the UV sub range was used or participated with another one) to 8.1 percent (when only the NIR sub range was used). For the medium and coarse fractions averaged errors showed the same tendency of dependence on the sub range(s), however, with higher values that increased with an increase in particle size. In conclusion, within the used fractions of particle size and spectral ranges, the most sensitive to the presence of damaged material were models developed for the finest fraction and when the UV sub range was used in modeling.
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