PROCESS YIELD AND CAPABILITY INDICES

Daniel Grau (1)

1 LMAP - Laboratoire de Mathématiques et de leurs Applications [Pau]

Capability indices were introduced to compare the performance of various processes independently of their tolerance interval. The concept of performance, related at first to the proportion of conforming items (process yield), quickly evolved to take into account the process position in relation to its target (process centering), as well. If the links between capability indices and process centering have already been studied, those between capability indices and processes yield have only been partly studied. In this paper we clarify the links between the process yield and the indices $C_p(u,v)$.

Keywords: Asymmetric tolerances; Process capability indices; Process centering; Process yield

Domains: Statistics [math.ST]; Statistics Theory [stat.TH]

Daniel Grau. PROCESS YIELD AND CAPABILITY INDICES. 2009. ⟨hal-00440254v1⟩