Journal Articles
Microelectronics Reliability
Year : 2009
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https://hal.science/hal-00400457
Submitted on : Tuesday, June 30, 2009-6:21:35 PM
Last modification on : Wednesday, August 2, 2023-4:40:25 PM
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- HAL Id : hal-00400457 , version 1
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Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse †, Jean-Luc Levant. Electromagnetic immunity model of an ADC for microcontroller's reliability improvement. Microelectronics Reliability, 2009, 49. ⟨hal-00400457⟩
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