Experimental Equipment for Studying the Residual Stresses Developed During High Temperature Reactions by X-Ray Diffraction

F. Bernard , E. Sciora , N. Gerard

This paper describes a device dedicated to studyng, by X-ray diffraction the residual stresses developed on surface samples as a function of temperature and atmosphere conditions. The setup consists of : a.) an horizontal axis goniometer which allows the programmed positionning of the sealed X-ray source and of the linear detector. b.) a high temperature controlled atmosphere chamber Particular attention has been paid to the thermal stability up to 1200°C and the accurate position on the sample.

Domaines: Articles anciens

F. Bernard, E. Sciora, N. Gerard. Experimental Equipment for Studying the Residual Stresses Developed During High Temperature Reactions by X-Ray Diffraction. Journal de Physique IV Proceedings, 1996, 06 (C4), pp.C4-259-C4-266. ⟨10.1051/jp4:1996424⟩. ⟨jpa-00254307⟩