HREM Characterization of Interfaces in Thin MOCVD Superconducting Films

Dominique Dorignac , Sylvie Schamm-Chardon , Ch. Grigis , J. Santiso , G. Garcia , A. Figueras

This paper is concerned with high-Tc, superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces - yttria stabilized zirconia buffer / (1-102)-sapphire substrate, YBa2Cu3O7-x film / Y2O3 precipitates as well as YBa2Cu3O7-x film / (001)-NdGaO3, -SrTiO3, and -MgO substrates - has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.

Domaines: Articles anciens

Dominique Dorignac, Sylvie Schamm-Chardon, Ch. Grigis, J. Santiso, G. Garcia, et al.. HREM Characterization of Interfaces in Thin MOCVD Superconducting Films. Journal de Physique IV Proceedings, 1995, 05 (C5), pp.C5-927-C5-934. ⟨10.1051/jphyscol:19955110⟩. ⟨jpa-00253779⟩