Properties of Dislocations in HgCdTe Crystals
Résumé
Dislocations in Hg1-xCdxTe (x≈0.2) single crystals have been introduced either by plastic deformation or by Al-implantation at high dose. Structural analysis of implanted samples, using Huang's method shows that dislocation loops are mainly of interstitial type with a radius of about 2.6 nm. Electrical properties of uniaxially deformed samples, using Hall effect, indicate the presence of both acceptor-like type dislocations along with donor-type point defects.
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