In-Situ Survey System of Resistive and Thermoelectric Properties of Either Pure or Mixed Materials in Thin Films Evaporated Under Ultra High Vacuum

L. Lechevallier , J.-Y. Le Huerou , G. Richon , J.-M. Sarrau , J. Gouault

The study of thermoelectric and resistive in situ behaviours depending on temperature for thin films of either pure or composite materials obtained under ultra-high vacuum, is very interesting, since they can be used as strain gauges or superficial resistances. However, studies become particularly difficult when the measurements generate very low-level electrical signals. Indeed, these turn out to be hardly detectable because of the perturbations brought by the experimental environment. The apparatus described below allows for the measurement of resistance with a relative uncertainty of 2×10-4, resistance variation with an absolute uncertainty of 2 mΩ and thermoelectric e.m.f. of about 2 μV. Films studied in the laboratory generally exhibit resistances lower than 100 Ω and resistance variations due to temperature variations of about a few ohms. So this device has sufficient technical characteristics for our studies. It can be connected to a PC, which allows for easy data collection and treatment.

Domaines: Articles anciens

L. Lechevallier, J.-Y. Le Huerou, G. Richon, J.-M. Sarrau, J. Gouault. In-Situ Survey System of Resistive and Thermoelectric Properties of Either Pure or Mixed Materials in Thin Films Evaporated Under Ultra High Vacuum. Journal de Physique III, 1995, 5 (4), pp.409-418. ⟨10.1051/jp3:1995136⟩. ⟨jpa-00249319⟩