A COMPUTER CONTROLLED SCANNING PROBE-HOLE FIELD EMISSION MICROSCOPE

R. Wolf , J. Bakker , B. Nieuwenhuys

A microprocessor controlled Field Emission Microscope is presented. It is capable of measuring changes in work function on different single crystal surfaces present on a field emission tip. During experiments the tip temperature can be measured with an accuracy of 1K. The field emission set up was tested with a series of experiments in which hydrogen was desorbed from a few selected rhodium surfaces.

Domaines: Articles anciens

R. Wolf, J. Bakker, B. Nieuwenhuys. A COMPUTER CONTROLLED SCANNING PROBE-HOLE FIELD EMISSION MICROSCOPE. Journal de Physique Colloques, 1988, 49 (C6), pp.C6-43-C6-48. ⟨10.1051/jphyscol:1988608⟩. ⟨jpa-00228105⟩