ATOM PROBE FIM STUDY OF AN AMORPHOUS Pd-Si ALLOY

M. Yamamoto , H. Yao , S. Nenno , I. Ohnaka , T. Fukusako

The amorphous structure of Pd84Si16 alloy wire obtained by inrotating-liquid spinning method from the liquid state, has been studied, in an atomic scale, by atom-probe field-ion microscopy. In the as-solidified specimen of Pd84Si16 alloy, whose electron diffraction pattern shows single halo ring, compositional fluctuation is found to exist in the range of 8 to 24 at% Si. The fluctuation is of the period of a few tenth nanometer, and it does not have long-range periodicity. We have discussed these experimental results with microcompositional fluctuation in terms of both amorphous structure itself and artifact effect with field evaporation.

Domaines: Articles anciens

M. Yamamoto, H. Yao, S. Nenno, I. Ohnaka, T. Fukusako. ATOM PROBE FIM STUDY OF AN AMORPHOUS Pd-Si ALLOY. Journal de Physique Colloques, 1987, 48 (C6), pp.C6-311-C6-316. ⟨10.1051/jphyscol:1987651⟩. ⟨jpa-00226856⟩