THE EFFECT OF CARBON BEARING GASES AND SECONDARY ELECTRON BOMBARDMENT ON A LIQUID METAL ION SOURCE

P. Sudraud , Jean Orloff , Gérard Benassayag

The influence of residual gases on the noise and life time of liquid metal ion sources (LMIS) has been found to be significant if secondary electrons impinge upon the emitter surface. A straight forward method of preventing electron bombardment of the LMIS in a ion gun structure is shown.

Domaines: Articles anciens

P. Sudraud, Jean Orloff, Gérard Benassayag. THE EFFECT OF CARBON BEARING GASES AND SECONDARY ELECTRON BOMBARDMENT ON A LIQUID METAL ION SOURCE. Journal de Physique Colloques, 1986, 47 (C7), pp.C7-381-C7-387. ⟨10.1051/jphyscol:1986765⟩. ⟨jpa-00225960⟩