LOCAL STRUCTURE IN SiO2 GLASSES BY OXYGEN K EDGE XANES

A. Marcelli , I. Davoli , A. Bianconi , J. Garcia , A. Gargano , C. Natoli , M. Benfatto , P. Chiaradia , M. Fanfoni , E. Fritsch , G. Calas , J. Petiau

The X ray absorption near edge structure (XANES) spectra, at the oxygen K edge, of well characterized silica glasses have been measured using the grasshopper beam line at the Frascati synchrotron radiation facility. Oxygen XANES are shown to be a probe of oxygen site geometry of glasses. Multiple scattering calculations of XANES for a simple Si-O-Si cluster have been performed and demonstrate the sensibility of XANES to bonding angles via higher order correlation function of atomic distribution. The feasibility of Si-O-Si bridging bond angle and of Si-O distance determination and indication of different average bridging bond angles in different silica glasses by XANE is reported.

Domaines: Articles anciens

A. Marcelli, I. Davoli, A. Bianconi, J. Garcia, A. Gargano, et al.. LOCAL STRUCTURE IN SiO2 GLASSES BY OXYGEN K EDGE XANES. Journal de Physique Colloques, 1985, 46 (C8), pp.C8-107-C8-112. ⟨10.1051/jphyscol:1985813⟩. ⟨jpa-00225156⟩