ELECTROMIGRATION IN d.c. ELECTROLUMINESCENT THIN FILMS OF ZnS

G. Jakubowska

The degradation of the light emission from electroluminescent /EL/ ZnS structures is tentatively explained in terms of copper ion migration. The migration of copper ions affects the properties of the layer close to the positive electrode which appears bright. Some changes in the electrode surface and the precipitation of substantial amounts of copper were observed by means of the optical and electron microscopes.

Domaines: Articles anciens

G. Jakubowska. ELECTROMIGRATION IN d.c. ELECTROLUMINESCENT THIN FILMS OF ZnS. Journal de Physique Colloques, 1983, 44 (C10), pp.C10-277-C10-280. ⟨10.1051/jphyscol:19831058⟩. ⟨jpa-00223516⟩