Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell

William Souza da Cruz (1) , Jean-Max Dutertre (1) , Jean-Baptiste Rigaud (1) , Hubert Guillaume (2)

1 Mines Saint-Étienne MSE - École des Mines de Saint-Étienne
2 DPHY, ONERA, Université de Toulouse [Toulouse]

Hardware redundancy techniques are routinely used for mitigation purposes in radiation-hardened integrated circuits. Duplication indeed has been proved effective to harden the well known dice memory cell against seus. In this work, we nonetheless report, on simulation basis, the possibility of a dynamic fault mechanism that may turn an set into an error. We also introduce and validate a countermeasure that alleviates this weakness.

Mots clés: CIRCUIT INTEGRE; ANALYSE DES SYSTÈMES

Domaines: Sciences de l'ingénieur [physics]

William Souza da Cruz, Jean-Max Dutertre, Jean-Baptiste Rigaud, Hubert Guillaume. Evidence of a Dynamic Fault Model in the DICE Radiation-Hardened Cell. 2020 33rd Symposium on Integrated Circuits and Systems Design (SBCCI), Aug 2020, Campinas, Brazil. pp.1-6, ⟨10.1109/SBCCI50935.2020.9189897⟩. ⟨hal-03217265⟩