Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10 −5 resolution

Xavier Biquard (1) , P. Ballet (2) , A. Tuaz (2) , Pierre-Henri Jouneau (3) , F. Rieutord (4)

1 NRS - Nanostructures et Rayonnement Synchrotron
2 CEA-LETI - Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information
3 LEMMA - Laboratoire d'Etude des Matériaux par Microscopie Avancée
4 MEM - Modélisation et Exploration des Matériaux

Mots clés: HgCdTe; Laue diffraction; high strain resolution; strain; microdiffraction; IR

Domaines: Science des matériaux [cond-mat.mtrl-sci]

Xavier Biquard, P. Ballet, A. Tuaz, Pierre-Henri Jouneau, F. Rieutord. Submicronic Laue diffraction to determine in-depth strain in very closely matched complex HgCdTe/CdZnTe heterostructures with a 10 −5 resolution. Journal of Synchrotron Radiation, 2021, 28 (1), pp.181 - 187. ⟨10.1107/S1600577520013211⟩. ⟨hal-03025086⟩