An 1d-beam approach for both stress analysis and fatigue life prediction of bonded joints

Eric Paroissien (1) , Anthony da Veiga (1) , Audrey Laborde (1)

1 Sogeti High Tech

An approach for both stress analysis and fatigue life prediction of bonded joints, based on a 1D-beam model, is presented. Only the adhesive is supposed to fail. The Goland and Reissner framework [1] is extended to unbalanced laminar or monolithic adherends under thermal loads. The J-integral is derived and employed in a modified Paris law, leading to fatigue lives, which are assessed w.r.t. published experimental results [2,3].

Mots clés: Bonded Joints; Stress analysis; Fatigue analysis; Macro-element

Domaines: Autre

Eric Paroissien, Anthony da Veiga, Audrey Laborde. An 1d-beam approach for both stress analysis and fatigue life prediction of bonded joints. 26th ICAF Symposium, Jun 2011, Montréal, Canada. pp.359-374. ⟨hal-01923420⟩