Study of the enhanced electromigration performance of Cu(Mn) by low-frequency noise measurements and atom probe tomography

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https://hal.archives-ouvertes.fr/hal-01766131
Contributor : Etienne Talbot <>
Submitted on : Friday, April 13, 2018 - 12:17:01 PM
Last modification on : Thursday, April 25, 2019 - 9:28:05 AM

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Sofie Beyne, Laurent Arnoldi, Ingrid de Wolf, Zsolt Tőkei, Kristof Croes. Study of the enhanced electromigration performance of Cu(Mn) by low-frequency noise measurements and atom probe tomography. Applied Physics Letters, American Institute of Physics, 2017, 111 (8), ⟨10.1063/1.4989898⟩. ⟨hal-01766131⟩

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