Microscopic thermal characterization at temperatures up to 1000C by photoreflectance microscopy

H Le Houëdec (1) , D Rochais (1) , Franck Enguehard (1) , J Jumel (1) , F Lepoutre (2)

1 CEA Le Ripault - CEA Le Ripault
2 ONERA - The French Aerospace Lab [Châtillon]

Micrometric scale thermal diffusivity measurement by photoreflectance microscopy is now a well-known technique. Until now the experiments were performed essentially at room temperature; in this article we explore temperature resolved tests. We describe the modifications introduced in the experimental setup and the procedure followed to determine the temperature dependent diffusivity. Different analysis methods are described: 2D scanning, least squares adjustment of one or several 1D phase profiles, and a new one better adapted to studies at high temperatures: the fixed pump/probe offset technique.

Mots clés: Photoreflectance; Microscopy; Temperature; Characterization

Domaines: Thermique [physics.class-ph]

H Le Houëdec, D Rochais, Franck Enguehard, J Jumel, F Lepoutre. Microscopic thermal characterization at temperatures up to 1000C by photoreflectance microscopy. Superlattices and Microstructures, 2004, ⟨10.1016/j.spmi.2003.10.006⟩. ⟨hal-01287487⟩