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Modeling Local and Global Deformations in Deep Learning: Epitomic Convolution, Multiple Instance Learning, and Sliding Window Detection

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https://hal.inria.fr/hal-01263611
Contributor : Iasonas Kokkinos <>
Submitted on : Wednesday, January 27, 2016 - 9:43:29 PM
Last modification on : Thursday, March 5, 2020 - 4:56:36 PM

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  • HAL Id : hal-01263611, version 1

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George Papandreou, Iasonas Kokkinos, Pierre-André Savalle. Modeling Local and Global Deformations in Deep Learning: Epitomic Convolution, Multiple Instance Learning, and Sliding Window Detection . IEEE Conference on Computer Vision and Pattern Recognition, Jun 2015, Boston, United States. ⟨hal-01263611⟩

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