Numerical modeling and prediction of thermomechanical degradation of power electronic packaging
Résumé
This work aims at numerical thermomechanical studies of two types of high temperature silver connections elaborated at low temperatures, the transient liquid phase bonding (TLPB) of Ag-In and silver nanoparticles sintering, using test vehicles representing the final packaging assemblies of diamond components. The simulation is performed using a finite element code on 2D and 3D assemblies. The stress distribution in the assemblies and in the two die-attachments was studied during thermal cycling in the range temperature between -50 and 300°C. A comparison of these two technology trends with respect to their applicability for power electronics packaging was conducted.
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