Polarization effects in X-ray resonant magnetic scattering patterns from striped FePd films

K. Chesnel (1) , M. Belakhovsky (1) , A. Marty (1) , G. Beutier (1) , G. van Der Laan (2) , S. P. Collins (2)

1 SP2M - UMR 9002 - Service de Physique des Matériaux et Microstructures
2 DIAMOND Light source

We recorded X-ray resonant magnetic scattering (XRMS) patterns from a 40nm thin FePd film that exhibits magnetic stripes with ~100nm period. Measurements were performed using a CCD camera in reflection geometry for different light polarizations at the Fe L3 resonance. We observed dichroic effects using circular polarization. By combining the scattering patterns obtained with both helicities we obtain the symmetric and antisymmetric part of the pattern. The experimental results are in agreement with a simple theoretical model.

Mots clés: Nanotechnology; Magnetic stripes; XRMS; Polarization; Dichroism

Domaines: Science des matériaux [cond-mat.mtrl-sci]

K. Chesnel, M. Belakhovsky, A. Marty, G. Beutier, G. van Der Laan, et al.. Polarization effects in X-ray resonant magnetic scattering patterns from striped FePd films. Physica B: Condensed Matter, 2004, 345, pp.148-152. ⟨10.1016/J.PHYSB.2003.11.042⟩. ⟨hal-00752487⟩