An extended LLRP model for RFID system test and diagnosis

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https://hal.archives-ouvertes.fr/hal-00676582
Contributor : Oum-El-Kheir Aktouf <>
Submitted on : Monday, March 5, 2012 - 4:24:56 PM
Last modification on : Monday, April 9, 2018 - 12:22:18 PM

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Rafik Kheddam, Oum-El-Kheir Aktouf, Ioannis Parissis. An extended LLRP model for RFID system test and diagnosis. The 8th Workshop on Advances in Model Based Testing, Apr 2012, Quebec, Canada. pp.10. ⟨hal-00676582⟩

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