SIC-testability of sequential logic controllers

Abstract : SIC (Single Input Change) test sequences must be privileged for conformance test of logic controllers, to prevent from erroneous test results when the test-bench and the implementation under test are not synchronized. This paper proposes first a definition of the SIC-testable part of a sequential specification model, i.e. the part of the model that can be tested by using a sequence starting from the initial state and for which only one input can change at one at the same time. Then, an algorithm to determine the SIC-testable part is given; if this part is the whole specification, the specification model is declared totally SIC-testable. Once the SIC-testable part obtained, a SIC sequence for conformance test of an implementation of this part can be generated. These contributions are exemplified on an example.
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Contributor : Julien Provost <>
Submitted on : Tuesday, August 31, 2010 - 3:30:05 PM
Last modification on : Thursday, February 9, 2017 - 4:01:36 PM
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Julien Provost, Jean-Marc Roussel, Jean-Marc Faure. SIC-testability of sequential logic controllers. 10th International Workshop on Discrete Event Systems - WODES 2010, Aug 2010, Berlin, Germany. pp.203--208. ⟨hal-00512767⟩



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