Characterization methods dedicated to nanometer-thick hBN layers
Résumé
Hexagonal boron nitride (hBN) has regained interest as a strategic component in graphene
engineering and in van der Waals heterostructures built with two dimensional materials. It is crucial
then, to handle reliable characterization techniques capable to assess the quality of structural and
electronic properties of the hBN material used.Wepresent here characterization procedures based on
optical spectroscopies, namely cathodoluminescence and Raman, with the additional support of
structural analysis conducted by transmission electron microscopy.Weshow the capability of optical
spectroscopies to investigate and benchmark the optical and structural properties of various hBN thin
layers sources.