Techniques and Prospects for Fault-tolerance in Post-CMOS ULSI

Yangyang Tang (1, 2) , Sundararajan Gopalakrishnan (2) , Chris Winstead (2) , Emmanuel Boutillon (1) , Christophe Jego (3) , Michel Jezequel (4)

1 Lab-STICC - Laboratoire des sciences et techniques de l'information, de la communication et de la connaissance
2 ece - Dept. of Electrical and Computer Engineering
3 Conception/CSN
4 Lab-STICC_TB_CACS_IAS

This paper presents a survey of fault-masking techniques suitable for tolerating short-duration transient upsets in minimum-scale switching devices. Two types of fault masking are considered. The first type, coded dual-modular redundancy (cDMR), represents a family of parity-checking methods suitable for correcting a low rate of transient upsets. The second type, Restorative Feedback (RFB), is a triple-modular solution suitable for compensating a higher rate of transient upsets. We show that cDMR can be used efficiently for crossbar-style logic, but is not efficient in general for all logic styles. By contrast, RFB offers a fixed redundancy, and can be applied in general to any logic circuit. Finally, we propose novel circuits for ternary Muller C implementation based on carbon nanotube FET devices.

Domaines: Electronique

Yangyang Tang, Sundararajan Gopalakrishnan, Chris Winstead, Emmanuel Boutillon, Christophe Jego, et al.. Techniques and Prospects for Fault-tolerance in Post-CMOS ULSI. ULSIWS 2012: 21st International Workshop on Post-Binary ULSI Systems, May 2012, France. pp.1-7. ⟨hal-00955755⟩