A study on the reliability improvement factor of fault tolerant mechanisms

Jongwhoa Na (1) , Dongwoo Lee (1)

1 Department of Avionics and Electronics Engineering

We present a study on the reliability improvement factor (RIF) to quantify the reliability of the various fault tolerant mechanisms at the system level. First, we find the system level failure rate using co-simulation models and statistical fault injection (StFi). We built co-simulation targets using SystemC simulation models of baseline single-core ARM7, dual-modular and triple-modular redundant ARM7 processors and Mibench embedded benchmark SW. Since the number of experiments in StFi is large, we utilized simulation kernel-modified simulated fault injection tool. Next, we calculated the RIF using the failure probability functions of the co-simulation targets. In this way, we were able to compare the reliability improvement of the fault tolerant mechanism at the system level.

Mots clés: statistical fault injection; reliability improvement factor; fault-tolerant processor; fault-tolerant mechanism

Domaines: Systèmes embarqués

Jongwhoa Na, Dongwoo Lee. A study on the reliability improvement factor of fault tolerant mechanisms. Safecomp 2013 FastAbstract, Sep 2013, Toulouse, France. pp.NC. ⟨hal-00926549⟩