Phase noise measurement of a narrow linewidth CW laser using delay lines approaches
Résumé
Two different laser phase noise measurement techniques are compared. One of these two techniques is based on a conventional and low cost delay line system which is usually set up for the linewidth measurement of semiconductor lasers. The results obtained with both techniques on a high spectral purity laser agree well and confirm the interest of the low cost technique. Moreover, an extraction of the laser linewidth using CAD tools is performed.
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